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MASKLESS METHOD TO SELECTIVELY ETCH PARYLENE-C FROM HIGH ASPECT RATIO NEURAL DEVICES

机译:从高纵横比神经装置中选择性地蚀刻聚对聚乙烯-C的掩模方法

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Neural interfaces connect signal processing electronics to the nervous system via implanted microelectrode arrays such as the Utah electrode array (UEA). The UEA is coated with a biocompatible Parylene-C layer. However, in order to form active sites, Parylene-C is removed from the electrode tips of the UEA. Currently, this is achieved by manually punching aluminum foil through the electrodes to the desired length and subsequent etching of Parylene-C in oxygen plasma. This method is not only operator dependent, but also results in non-uniform tip exposure in the array. This paper examines a novel maskless approach of selectively desinsulating the tips of the UEA by using the unique architecture of the UEA (aspect ratio 15:1) in its favor. This is achieved by biasing the back-plane of the UEA to the DC bias voltage resulting from the reactive ion etching (RIE) process. During the RIE the electric field is stronger at the tip of the electrode, leading to higher concentration of the oxygen plasma at the tip. As a result, the Parylene-C is selectively etched from the tip. The etching rate is controlled by the inductively coupled plasma (ICP) power, which controls the oxygen plasma density around the tip. The process yields high controllability and reproducibility in selectively etching the tips of the UEA. Furthermore, this method can be applied to other high aspect ratio structures, which have sharp tips.
机译:神经接口通过诸如犹他律电极阵列(UEA)的植入的微电极阵列将信号处理电子器件连接到神经系统。 UEA涂有生物相容性聚氨酯-C层。然而,为了形成活性位点,从UEA的电极尖端中取出聚苯乙烯-c。目前,这是通过将铝箔通过电极手动冲压到所需长度和随后的聚对氧等离子体中的乙酰乙烯-c的蚀刻来实现的。该方法不仅依赖于运算符,而且还导致阵列中的非均匀尖端曝光。本文通过使用UEA的独特架构(纵横比15:1)的独特架构来检查一种新颖的无掩模方法,可以使用UEA的独特结构(纵横比15:1)。这是通过将UEA的背平面偏置到由反应离子蚀刻(RIE)工艺产生的DC偏置电压来实现的。在RIE期间,电极的尖端处的电场更强,导致尖端处于较高浓度的氧等离子体。结果,从尖端选择性地蚀刻了聚酰胺-c。蚀刻速率由电感耦合等离子体(ICP)功率控制,其控制尖端周围的氧等离子体密度。该过程在选择性地蚀刻UEA的尖端方面产生高可控性和再现性。此外,该方法可以应用于具有尖锐尖端的其他高纵横比结构。

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