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Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment

机译:两百万周期侧壁接触实验中的原子尺度粘附现象

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In this work we measure the evolution of the adhesion force between two MEMS sidewalls in repeated contact. We use an optical displacement measurement technique to obtain single contact cycles with nanonewton accuracy. We find that when a contact is broken, the snap-off is not always instantaneous, but may happen gradually. The contact shows viscoelastic deformation, hinting at the presence of a tribo-synthesized rubber-like compound on the surface. The variability of the measured adhesion parameters is an important indicator for a change of the surface mechanics. We found that the adhesion force varies by a factor 2 during 3 million cycles, which presents a major reliability concern for MEMS devices with contacting surfaces.
机译:在这项工作中,我们在重复接触中测量两个MEMS侧壁之间的粘附力的演变。我们使用光学位移测量技术,以纳尼瓦顿精度获得单个接触循环。我们发现当接触被打破时,捕捉并不总是瞬间,但可能逐渐发生。接触显示粘弹性变形,在表面上存在摩擦合成的橡胶状化合物的暗示。测量粘合参数的可变性是用于表面力学的变化的重要指标。我们发现,在300万个周期期间,粘附力变化了2倍,这提出了具有接触表面的MEMS器件的主要可靠性问题。

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