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Analysis on the causes of decline of MLCC insulation resistance

机译:MLCC绝缘电阻下降原因分析

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In this paper, based on the results of SEM and EDS analysis, I would like to share the discovery of MLCC failure due to insulation resistance. For external factors, The defects which caused by mechanical stress can lead to lack of insulation resistance. For the intrinsic factors, MLCC insulation resistance failure is due to the presence of defects, and the main defects include void in ceramic dielectric and delamination of porcelain body and inner electrode. These defects are difficult to analyze. With the help of SEM electron microscope detection, these defets can be see. The reason is the poor control of sintering process.In the test,these defects will cause the capacitor quickly form a conductive channel, finally lead to insulation resistance failure.
机译:本文基于SEM和EDS分析的结果,我希望由于绝缘电阻分享MLCC故障的发现。对于外部因素,由机械应力引起的缺陷可能导致缺乏绝缘电阻。对于本质因素,MLCC绝缘耐药性是由于存在缺陷,并且主要缺陷包括在陶瓷电介质和瓷器体和内电极的分层中的空隙。这些缺陷难以分析。借助SEM电子显微镜检测,可以看到这些防守。原因是对烧结过程的控制差。在测试中,这些缺陷将导致电容器快速形成导电通道,最终导致绝缘电阻故障。

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