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Microscopic Studies on the Secondary Phases in LSCF after Cr Poisoning

机译:Cr中毒后LSCF中次生次级的显微镜研究

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Chromium poisoning is one of the critical issues leading to the degradation of LSCF. In this work, the poisoning experiment is carried out for 100 h with a low concentration of Cr source at a temperature of 700°C. We focus on the detection of the secondary phases after poisoning using high-resolution electron microscopy techniques. Scanning electron microscopy-energy dispersive spectroscopy (SEM-EDS) results indicate that there seem to be Cr/Sr-rich particles formation on the surfaces of grains. Scanning transmission electron microscopy-EDS analysis confirms that such particles are SrCrO_4. They form on the cathode surface and the entire cathode layer and are found mainly at the grain boundaries of LSCF open to the gas phase. The related instability of LSCF before and after poisoning is also discussed.
机译:铬中毒是导致LSCF降解的关键问题之一。在这项工作中,中毒实验在700℃的温度下以低浓度的Cr源进行100小时。我们专注于使用高分辨率电子显微镜技术中毒后检测二次相。扫描电子显微镜 - 能量分散谱(SEM-EDS)结果表明谷物表面似乎似乎是Cr / Sr的颗粒。扫描透射电子显微镜-EDS分析证实这些颗粒是Srcro_4。它们在阴极表面和整个阴极层上形成,并且主要发现在LSCF的晶界对气相中。还讨论了中毒前后LSCF的相关不稳定。

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