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Measurement of surface roughness effects on conductivity in the terahertz regime with a high-Q quasioptical resonator

机译:利用高Q Quasootical谐振器测量太赫兹制度在太赫兹方案中的电导率的测量

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摘要

A high-Q quasi-optical resonator is used to experimentally measure metal samples with controlled nano-scale textures at 400 GHz and 650 GHz. The results explore the effect of surface roughness on effective conductivity in the terahertz regime.
机译:高Q准光谐振器用于通过400GHz和650GHz在实验中测量具有受控纳米尺度纹理的金属样品。结果探讨了表面粗糙度对太赫兹制度有效电导率的影响。

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