Abetting Planned Obsolescence by Aging 3D Networks-on-Chip

摘要

We set up a security analysis framework by aging the Network-on-Chip (NoC) to study planned obsolescence by the original equipment manufacturer (OEM). An NoC is the communication backbone in a manycore System-on-Chip (SoC). Planned obsolescence may adopt any vulnerability in the NoC to cause the SoC to fail. We show how an OEM can craft workloads to generate electromigration-induced stress and crosstalk noise in TSV-based vertical links in the NoC to hasten failure. We analyzed three malicious workloads and confirm that a crafted workload that injects 3-10% more traffic on to a few selected critical vertical links can shorten the lifetime of the NoC by 11%-25% averaged over the benchmarks considered in this work.