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Simulation of the contact resistance of high voltage apparatus with the method of coupling contact surface

机译:接触面耦合法模拟高压设备的接触电阻

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Heat generation and temperature rise are important indicators to measure the performance of high-voltage apparatus. Due to the electrical contact phenomena, the heat generated on the contact parts of high-voltage apparatus is a key issue in the thermal analysis. However, as a traditional and commonly used contact resistance model, the contact bridge structure is inaccurate in simulating electrical contact and difficult to use in the complicated parallel multi-contacts structure of high-voltage apparatus. This paper presents a novel modeling approach to simulate the contact resistance. Employing this approach, it is not a necessity creating a geometrical structure between the pair of contacts (e.g. the contact bridge). Instead, coupling together the area on both sides of the contact surface, the current can only flow through the coupled surface. By controlling the value of the coupled surface area, the current constriction effect is achieved and the appropriate contact resistance value can be simulated. Simulation has been included in paper in order to illustrate the operation of the designed model. By comparing the simulation result and the empirical value, the novel approach was proved to be effective.
机译:发热和温升是衡量高压设备性能的重要指标。由于电接触现象,高压设备的接触部分产生的热量是热分析中的关键问题。然而,作为传统且常用的接触电阻模型,接触桥结构在模拟电接触时不准确,并且难以在高压设备的复杂的并联多接触结构中使用。本文提出了一种新颖的建模方法来模拟接触电阻。使用这种方法,不必在一对触点(例如,触点桥)之间创建几何结构。相反,将接触表面两侧的区域耦合在一起,电流只能流过耦合表面。通过控制耦合表面积的值,可以实现电流压缩效果,并且可以模拟合适的接触电阻值。为了说明所设计模型的运行,已在纸中进行了仿真。通过比较仿真结果和经验值,证明了该方法是有效的。

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