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Fully Integrated Low-Drop-Out Regulator Based on Event-Driven PI Control

机译:基于事件驱动PI控制的全集成低丢失调节器

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Modern SoC designs employ a number of power domains, many of which are often implemented by low-drop-out (LDO) regulators. The key overhead of the existing LDO design is the large off-chip output capacitor (C_(out)) for compensating a large/fast change in load current (I_(LOAD)). Miniaturizing and thus integrating C_(OUT) on a chip is highly desirable and theoretically possible by shortening the control loop latency. This can be achieved by employing a higher sampling frequency (F_(CLK)) in a synchronous time-driven digital LDO [1] and a high-speed amplifier in an analog LDO [2]. However, large power consumption and the resulting low current efficiency are often inevitable. In this work, we aim to break this trade-off between passive size and efficiency by introducing an event-driven (ED) control scheme. We design the level-crossing event detector and the ED PI controller for short latency. The power dissipation is kept small since no event occurs in the steady state. We prototype a 400μA class LDO with typical V_(IN)=0.5V and V_(OUT)=0.45V in 65nm, achieving a small voltage droop (V_(DRDOP)) of 40mV (<9% of set-point voltage [V_(SP)] of 450mV) with an on-chip integrated C_(OUT) of 0.4nF and the peak current efficiency of 96.3%.
机译:现代SoC设计采用许多电源域,其中许多通常由低丢弃(LDO)调节器实现。现有LDO设计的关键开销是大量的异片输出电容(C_(OUT)),用于补偿负载电流的大/快速变化(I_(LOAD))。通过缩短控制回路延迟,在芯片上的小型化和因此集成C_(OUT)是非常理想的和理论上的。这可以通过在同步时间驱动的数字LDO [1]中采用更高的采样频率(F_(CLK))和模拟LDO中的高速放大器[2]来实现。然而,大功耗和由此产生的低电流效率通常是不可避免的。在这项工作中,我们的目的是通过引入事件驱动的(ED)控制方案来在被动规模和效率之间打破这种权衡。我们设计用于短延迟的级别交叉事件检测器和ED PI控制器。由于在稳定状态下不会发生任何事件,因此功耗耗散。我们用典型的v_(in)= 0.5V和v_(out)= 0.45V以65nm的小电压下垂(v_(drdop))为40mV(<9%的设定点电压[v_] (SP)] 450mV),片上集成C_(OUT)为0.4NF,峰值电流效率为96.3%。

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