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Response of Long Sculpted Wire Bonds to Vibrational Excitation

机译:长雕刻的引线键合对振动激励的响应

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The pitch of wire bond connections is decreasing to meet the need for higher interconnect densities, while at the sametime, the ratio of wire length to diameter is increasing, which lowers the mechanical resonant frequency of the wire. Inmany applications in which MEMS sensors are coupled with ASIC front end electronics, the bonded wires can besubjected to a wide frequency spectrum of mechanical vibrations. One potential consequence is that the parasiticcapacitances of the sensor could vary dynamically at a magnitude comparable to that of the sensor signal. In extreme cases,intermittent shorts or fatigue failures of the wire bonds could occur. A recent paper by Barber et. al, showed that wirebonds carrying alternating currents in a strong magnetic field could suffer fatigue failure.[1] Their analysis andexperiments focused on simple loop geometries. In many applications, more complex wire bond geometries are used tominimize loop height and obtain dense wiring in stacked chip configurations. These geometries give rise to many morevibration modes with unique resonant frequencies and displaced shapes. We have used simple analytical beam models inconjunction with finite element models (FEM) to study various wire bond configurations subject to mechanical vibratoryexcitation. We focused on the effects of overall wire length and geometric shape on resonant modes. The finite elementmodels were also used to calculate the capacitance between adjacent wires subject to mechanical excitation at one or moreof their resonant frequencies. We show that there is an apparent shift in the time averaged capacitive coupling thatincreases with increasing vibration amplitude.
机译:引线键合连接的间距不断减小,以满足对更高互连密度的需求 随着时间的流逝,导线长度与直径的比率增加,这降低了导线的机械共振频率。在 在MEMS传感器与ASIC前端电子设备耦合的许多应用中,键合线可以是 受到广泛的机械振动频谱的影响。一种潜在的后果是寄生 传感器的电容可以以与传感器信号相当的幅度动态变化。在极端的情况下, 可能会发生断续的短路或引线键合的疲劳故障。 Barber等人的最新论文。铝,表明电线 在强磁场中承载交流电的键可能会遭受疲劳破坏。[1]他们的分析和 实验着重于简单的回路几何形状。在许多应用中,更复杂的引线键合几何形状用于 最小化回路高度,并在堆叠芯片配置中获得密集的布线。这些几何形状带来了更多 具有独特共振频率和位移形状的振动模式。我们在其中使用了简单的分析光束模型 与有限元模型(FEM)结合使用,以研究受机械振动影响的各种焊线配置 励磁。我们专注于整体导线长度和几何形状对共振模式的影响。有限元 模型还用于计算在一个或多个机械激振作用下相邻导线之间的电容 他们的共振频率。我们表明,时间平均电容耦合存在明显的偏移, 随着振动幅度的增加而增加。

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