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Intelligent Built-in Test Fault Diagnosis and Prediction for Mechatronics Equipment

机译:机电设备的智能内置测试故障诊断与预测

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This paper proposes an intelligent Built-in Test (BIT) technology based on wavelet packet analysis and gray neural network. The aim is to improve the fault diagnosis and prediction capability of intelligent BIT. Firstly, the energy of each frequency-band was computed to form the eigenvectors by using the wavelet packet decomposition, then the energy eigenvectors were used as samples to the forecasting model, which were based on wavelet packet analysis and gray neural network. Finally, the proposed method was applied to the BIT system of the airborne mechatronics, and the results have shown that the proposed method could improve the performance of the intelligent BIT system.
机译:本文提出了一种基于小波包分析和灰色神经网络的智能内置测试(BIT)技术。目的是提高智能BIT的故障诊断和预测能力。首先,基于小波包分析和灰色神经网络,通过小波包分解计算各个频带的能量,形成特征向量,然后将能量特征向量作为预测模型的样本。最后,将该方法应用于机载机电一体化BIT系统,结果表明该方法可以提高智能BIT系统的性能。

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