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Techniques for de-embedding a high port count connector to PCB via interposer

机译:通过插入器将高端口数连接器去嵌入PCB的技术

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In this paper, we propose, design, fabricate and test an interposer that provides a convenient and stable connection between a via-array-type device under test (DUT) and coaxial interface measurement instruments in a frequency band up to 20GHz. A 3D EM model based de-embedding technique is adopted to remove the influence of the interposer from measurements. The validity and repeatability of the apparatus and de-embedding technique are verified by comparing to microwave probe measurements on individual channels. The impact of misregistration arising from PCB fabrication is analyzed based on the measurements of up to three differential pairs in adjacent layers using a 12 port configuration.
机译:在本文中,我们提出,设计,制造和测试中介层,该中介层可在频率高达20GHz的通道阵列型被测器件(DUT)与同轴接口测量仪器之间提供方便,稳定的连接。采用基于3D EM模型的去嵌入技术,可从测量结果中消除中介层的影响。通过与单个通道上的微波探头测量结果进行比较,验证了该设备和去嵌入技术的有效性和可重复性。基于使用12端口配置的相邻层中多达三个差分对的测量结果,分析了PCB制造引起的配准不良的影响。

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