首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >FORMATION OF A LOW OHMIC CONTACT NICKEL SILICIDE LAYER ON TEXTURED SILICON WAFERS USING ELECTROLESS NICKEL PLATING
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FORMATION OF A LOW OHMIC CONTACT NICKEL SILICIDE LAYER ON TEXTURED SILICON WAFERS USING ELECTROLESS NICKEL PLATING

机译:使用化学镀镍电镀在纹理硅晶片上形成低欧姆接触镍硅化物层

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This paper presents a low cost process for fabrication of high efficiency silicon-based solar cells from front side ARC patterning through contact line metallization. This process utilizes a screen printable etch resist to define the contact pattern and a wet etching solution to remove the exposed ARC layer. The metallization stack for the contact line pattern consists of a nickel silicide ohmic contact and a nickel and copper metal stack plated using a light induced plating (LIP) process. The nickel silicide contact is formed by annealing a thin nickel seed layer that is deposited on the silicon surface using two different alternative seed layer (ASL) processes, chemically activated and light assisted electroless plating. Through optimization of the ASL processes, a thin, uniform NiSi layer is achieved that is less than 200 nm. This thin NiSi layer should be compatible with shallow emitter silicon solar cells. An LIP process for nickel and copper over the NiSi contact areas is demonstrated.
机译:本文介绍了通过接触线金属化从前侧电弧图案制造高效硅基太阳能电池的低成本过程。该过程利用屏幕可印刷蚀刻抗蚀剂来限定接触图案和湿法蚀刻溶液以除去暴露的弧形层。用于接触线图案的金属化叠层由硅化镍欧姆接触和使用光诱导电镀(唇)工艺电镀的镍和铜金属叠层组成。镍硅化镍触点是通过使用两层不同的替代种子层(ASL)工艺,化学活化的和光辅助化学镀在硅表面上沉积在硅表面上的薄镍种子层来形成。通过优化ASL过程,实现小于200nm的薄,均匀的NISI层。这种薄的NISI层应与浅发射器硅太阳能电池兼容。证明了NISI接触区域上镍和铜的唇缘工艺。

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