首页> 外文会议>IEEE international conference on computer science and information technology >A Method of Testing Integrated Operational Amplifier Gain Characteristics
【24h】

A Method of Testing Integrated Operational Amplifier Gain Characteristics

机译:一种测试集成的运算放大器增益特性的方法

获取原文

摘要

When integrated operational amplifier (Op amp) is tested under open-loop,output voltage keeps swinging.Especially for high gain integrated Op amp,oscillation is stronger due to severe drift This paper presents a method that using two aid amplifiers.The basic idea is testing the input signal and output signal of the integrated Op amp indirectly with two aid amplifiers to obtain the open-loop gain.The output signal is measured by aid amplifier ) (AD8055_1) which is a voltage follower in the circuit,and the input signal is tested by aid amplifier 2(AD80S5_2) which can amplify input signal tenfold.The results show that this method overcomes the measurement errors caused by zero drift and errors generated in testing small signals.All signals are analyzed precisely by network analyzer (NA).
机译:当在开环下测试集成的运算放大器(运算放大器)时,输出电压保持摆动。专为高增益集成运算放大器,由于严重漂移,振荡更强,本文提出了一种使用两个辅助放大器的方法。基本的想法是一种方法用两个辅助放大器间接地测试集成运算放大器的输入信号和输出信号,以获得开环增益。通过辅助放大器测量输出信号)(AD8055_1),其是电路中的电压跟随器,以及输入信号通过辅助放大器2(AD80S5_2)测试,该辅助放大器2(AD80S5_2)可以放大输入信号十倍。结果表明该方法克服了由零漂移引起的测量误差和在测试小信号中产生的误差。通过网络分析仪(NA)精确地分析了信号。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号