Built-In Self-Test for multipliers in Altera Cyclone II Field Programmable Gate Arrays

摘要

This paper describes a Built-In Self-Test (BIST) approach designed to verify the integrity of the embedded multiplier cores in Altera Cyclone II Field Programmable Gate Arrays (FPGAs). This approach uses an architecture independent test algorithm implemented with parameterized VHDL to support all FPGAs in the Cyclone II family. The BIST is capable of detecting faults within all of the multiplier's modes of operation in three downloads and can identify the location of faulty multiplier(s).¹