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From RTL to silicon: The case for automated debug

机译:从RTL到芯片:自动调试的案例

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Computer-aided design tools are continuously improving their scalability and efficiency to mitigate the high cost associated with designing and fabricating modern VLSI systems. A key step in the design process is the root-cause analysis of detected errors. Debugging may take months to close, introduce high cost and uncertainty ultimately jeopardizing the chip release date. This study makes the case for debug automation in each part of the design flow (RTL to silicon) to bridge the gap. Contemporary research, challenges and future directions motivate for the urgent need in automation to relieve the pain from this highly manual task.
机译:计算机辅助设计工具正在不断提高其可扩展性和效率,以减轻与设计和制造现代VLSI系统相关的高成本。设计过程中的关键步骤是对检测到的错误进行根本原因分析。调试可能要花费数月才能完成,这会带来高昂的成本和不确定性,最终危及芯片的发布日期。这项研究为在设计流程的每个部分(RTL到硅片)调试自动化以弥合差距提供了理由。当前的研究,挑战和未来方向激发了对自动化的迫切需求,以减轻这一高度手动的任务带来的痛苦。

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