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Determination of crack initiation and crack growth stress-life curves by fracture mechanics experiments and statistical analysis

机译:裂缝力学实验和统计分析测定裂纹启动和裂纹生长胁迫 - 寿命曲线

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It is well known that the fatigue lifetime of a notched component consists of the crack initiation lifetime (crack size equal to the characteristic microstructure size) and the crack growth lifetime. The crack growth lifetime is easily calculated if the initial crack size is known. A much more difficult task is to define a suitable initial crack size and to determine the initiation lifetime of such a crack. In the present contribution, a method is proposed to determine the crack initiation as well as the crack growth lifetime within a conventional fracture mechanics setup. To this purpose, single edge notched bending (SENB) specimens were manufactured with two different notch geometries. For measuring the crack length, the direct current potential drop (DCPD) technique was used. The DCPD results are not only used for crack growth assessment, but also for determining the point - or range, respectively - of crack initiation. By a statistical assessment of DCPD measurements at different load stress levels, it is possible to determine crack initiation and crack growth stress-life (S/N) curves, and in particular to assess the influence of the notch geometry on the crack initiation lifetime. The lower statistical tolerance limits of these curves may be used as criteria for mechanical design and determination of inspection intervals.
机译:众所周知,缺口组分的疲劳寿命包括裂纹启动寿命(裂缝尺寸等于特征微观结构尺寸)和裂纹生长寿命。如果已知初始裂纹尺寸,容易计算裂缝增长寿命。更困难的任务是定义合适的初始裂缝尺寸,并确定这种裂缝的起始寿命。在本贡献中,提出了一种方法来确定常规断裂力学设置内的裂纹启动以及裂纹生长寿命。为此目的,用两种不同的凹口几何形状制造单边缘切口弯曲(SENB)标本。为了测量裂缝长度,使用直流电位降(DCPD)技术。 DCPD结果不仅用于裂纹增长评估,还用于确定分别的裂纹引发点或范围。通过对不同负载应力水平的DCPD测量的统计评估,可以确定裂纹启动和裂纹生长应力 - 寿命(S / N)曲线,特别是评估凹口几何体对裂纹启动寿命的影响。这些曲线的较低统计公差限制可以用作机械设计的标准和检查间隔的确定。

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