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Error Analysis and Correction of Grating Interference Displacement Measurement System

机译:光栅干扰位移测量系统的误差分析与校正

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Main error source, error characteristics and its correction method have a detailed analysis of the grating interference displacement measuring system in this paper. Through the error separation and compensation method, its system error is modified. Random error is separated through frequency spectrum analysis method. Experimental results show that, the system accuracy can be improved from micron or submicron magnitude to nanometer level by these error correction methods. This system can realize nanometer level measurement.
机译:主误差源,误差特性及其校正方法对本文的光栅干扰位移测量系统进行了详细分析。通过错误分离和补偿方法,修改其系统错误。通过频谱分析方法分离随机误差。实验结果表明,通过这些误差校正方法可以从微米或亚微米幅度到纳米级别改善系统精度。该系统可以实现纳米电平测量。

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