Thin film based nanocalorimetry is suitable to measure thermal properties of samples with very small mass at fast heating/cooling rates. Assessing and controlling temperature distribution over the sample is critical for accurate measurements, and sample coverage has shown to significantly affect measured temperatures and associated heats of transitions or reactions. Here, using aluminum thin film as a model material, the effects of different patterns of sample coverage on measured melting temperature and enthalpy of fusion were studied, and a model of the dynamics of the temperature distribution is established to understand the mechanism, as a guideline for the ideal sample coverage for chip-based thermal measurements.
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