The Influence of Surface Chemistry on GSR Particles: Using XPS to Complement SEM/EDS Analytical Techniques

摘要

Gunshot residue particles (GSR) were examined using scanning electron microscopy/energy dispersive X-ray spectroscopy (SEM/EDS) to illustrate the size, shape, morphology, and elemental composition normally observed in particulate resulting from a discharged firearm. Determining the presence of lead (Pb), antimony (Sb), and barium (Ba), barring other elemental tags, fused together in a single particle with the correct morphology, is all that is required for the positive identification of GSR. X-ray photoelectron spectroscopy (XPS), however, can reveal more detailed information on surface chemistry than SEM/EDS. XPS is a highly surface-sensitive (≤ ～10 nm), non-destructive, analytical technique that provides qualitative information for all elements except hydrogen and helium. Nanometer-scale sampling depth and its ability to provide unique chemical state information make XPS a potential technique for providing important knowledge on the surface chemistry of GSR that complements results obtained from SEM/EDS analysis.