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Behavior of CuCr and WCu contacts during making tests at high voltage and high currents

机译:在高电压和高电流下进行测试时,CuCr和WCu触点的行为

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Contact welding is a major problem in the medium voltage vacuum interrupters. Different solutions can be proposed such as adding a third element or increasing Cr content in the CuCr contacts. Moreover WCu contacts can be used even if the current breaking performance is decreased. To understand the phenomena involved during a making test, an experimental vacuum closing device was designed that recreates the pre-arcing generated under a high voltage of 14kV. Currents from 5 to 50kA are injected so that the contacts can weld. The force to break this welding is then measured and various contact materials such as WCu (10 to 30% of copper) and CuCr (25 and 50% of Cr) can be classified. The arc can also be filmed during the contact closing, thus enabling the understanding of the evolution of the arc and the bounces. Making tests in VI and in the vacuum chamber are in good agreement and the anti-welding ability of WCu was found to be better than that of CuCr. However, during our experiments, no correlation could be shown between the pre-arcing times and the welding forces. The arc modify the contact surface which is strongly influential on the bounces, thus the pre-arcing time has an irregular evolution and is not indicative of a welding.
机译:接触焊接是中压真空灭弧室的主要问题。可以提出不同的解决方案,例如在CuCr触点中添加第三种元素或增加Cr含量。此外,即使电流断开性能降低,也可以使用WCu触点。为了了解制作测试中涉及的现象,设计了一个实验性真空闭合装置,该装置可重现在14kV高压下产生的预电弧。注入5至50kA的电流,以便触点可以焊接。然后测量破坏焊接的力,可以对各种接触材料进行分类,例如WCu(铜的10%至30%)和CuCr(25%和50%的Cr)。电弧也可以在触点闭合过程中拍摄,因此可以了解电弧和反弹的发展。在VI和真空室中进行测试是一致的,并且发现WCu的抗焊接能力比CuCr更好。但是,在我们的实验过程中,预电弧焊时间与焊接力之间没有相关性。电弧改变了对弹跳有很大影响的接触表面,因此预电弧时间具有不规则的演变并且不表示焊接。

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