首页> 外文会议>Quality Electronic Design (ISQED), 2010 >Automated silicon debug data analysis techniques for a hardware data acquisition environment
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Automated silicon debug data analysis techniques for a hardware data acquisition environment

机译:用于硬件数据采集环境的自动化硅调试数据分析技术

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Silicon debug poses a unique challenge to the engineer because of the limited access to internal signals of the chip. Embedded hardware such as trace buffers helps overcome this challenge by acquiring data in real time. However, trace buffers only provide access to a limited subset of pre-selected signals. In order to effectively debug, it is essential to configure the trace-buffer to trace the relevant signals selected from the pre-defined set. This can be a labor-intensive and time-consuming process. This paper introduces a set of techniques to automate the configuring process for trace buffer-based hardware. First, the proposed approach utilizes UNSAT cores to identify signals that can provide valuable information for localizing the error. Next, it finds alternatives for signals not part of the traceable set so that it can imply the corresponding values. Integrating the proposed techniques with a debugging methodology, experiments show that the methodology can reduce 30% of potential suspects with as low as 8% of registers traced, demonstrating the effectiveness of the proposed procedures.
机译:由于对芯片内部信号的访问受到限制,硅调试对工程师提出了独特的挑战。诸如跟踪缓冲区之类的嵌入式硬件通过实时获取数据来帮助克服这一挑战。但是,跟踪缓冲区仅提供对预选信号的有限子集的访问。为了有效调试,必须配置跟踪缓冲区以跟踪从预定义集中选择的相关信号。这可能是一个劳动密集且耗时的过程。本文介绍了一套技术,可以使基于跟踪缓冲区的硬件的配置过程自动化。首先,所提出的方法利用UNSAT核心来识别信号,这些信号可以为定位错误提供有价值的信息。接下来,它为不属于可跟踪集的信号找到替代方案,以便可以隐含相应的值。通过将所提出的技术与调试方法相结合,实验表明,该方法可以减少30%的潜在犯罪嫌疑人,而所跟踪的寄存器可低至8%,证明了所提出程序的有效性。

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