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Feature Detection by Structural Enhanced Information

机译:通过结构增强信息进行特征检测

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摘要

In this paper, we propose structural enhanced information for detecting main features in input patterns. In structural enhanced information, three types of enhanced information can be differentiated, that is, the first-, the second- and the third-order enhanced information. The first-order information is related to the enhancement of competitive units themselves through some elements in a network, and the second-order information is dependent upon the enhancement of competitive units with input patterns. Then, the third-order information is obtained by subtracting the effect of the first-order information from the second-order information. Thus, the third-order information more explicitly represents information on input patterns. With this structural enhanced information, we can estimate more detailed features in input patterns. We applied the method to the well-known Iris problem. In both problems, we succeeded in extracting detailed and important features especially by using the third-order information.
机译:在本文中,我们提出了用于检测输入模式主要特征的结构增强信息。在结构增强信息中,可以区分三种类型的增强信息,即一阶,二阶和三阶增强信息。一阶信息通过网络中的某些元素与竞争单位自身的增强有关,二阶信息取决于具有输入模式的竞争单位的增强。然后,通过从第二阶信息中减去第一阶信息的影响来获得第三阶信息。因此,三阶信息更明确地表示关于输入模式的信息。借助此增强的结构信息,我们可以估计输入模式中的更多详细功能。我们将该方法应用于众所周知的虹膜问题。在这两个问题中,我们都成功地提取了重要的详细特征,特别是通过使用三阶信息。

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