首页> 外文会议>International Conference on Textures of Materials;ICOTOM 15 >TEXTURE AND ANISOTROPY OF MP35N WIRE FOR CONDUCT LEADS
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TEXTURE AND ANISOTROPY OF MP35N WIRE FOR CONDUCT LEADS

机译:MP35N导线的纹理和各向异性

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The crystallographic texture, a measurement of grain orientation in materials, is a major factor contributing to mechanical properties and performance. In this study, the textures of four 0.178 mm diameter MP35N wires were analyzed to compare changes in texture with composition, process and manufacturer. The wire texture data was quantified by several texture components and the components were correlated to mechanical property and fatigue performance of wires. This study demonstrated that wire texture is a link between process and properties. The texture analysis was performed using Electron Backscatter Diffraction (EBSD).
机译:晶体学织构是材料中晶粒取向的度量,是影响机械性能和性能的主要因素。在这项研究中,分析了四根直径为0.178 mm的MP35N电线的织构,以比较织构随组成,工艺和制造商的变化。电线的纹理数据由几个纹理成分量化,并且这些成分与电线的机械性能和疲劳性能相关。这项研究表明,导线纹理是工艺和性能之间的联系。使用电子背散射衍射(EBSD)进行纹理分析。

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