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COMPARISON OF X-RAY AND EBSD TEXTURES FOR BACK-ANNEALED Al-Mg ALLOYS

机译:背面退火Al-Mg合金的X射线和EBSD纹理的比较

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Despite the large number of single grain orientation data, which can nowadays readily be obtained by standard EBSD measurements, the number of grains encountered is still small compared to the number of grains contributing to conventional X-ray macrotexture analysis. In this paper, we will compare macrotexture results obtained for Al-Mg alloy AA 5005 in the cold-rolled and various back-annealed states. The accuracy of EBSD textures is assessed by way of the statistical parameter p, which represents the relative mean square deviation between two textures. Furthermore, the impact of sampling step size on the statistical significance of EBSD texture results is investigated.
机译:尽管如今可以通过标准EBSD测量轻松获得大量的单晶粒取向数据,但与有助于常规X射线宏观纹理分析的晶粒数量相比,遇到的晶粒数量仍然很少。在本文中,我们将比较在冷轧和各种反向退火状态下,Al-Mg合金AA 5005的宏观织构结果。 EBSD纹理的准确性通过统计参数p进行评估,该参数代表两个纹理之间的相对均方差。此外,研究了采样步长对EBSD纹理结果的统计显着性的影响。

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