This article discusses methodology for constructing control charts to monitor percentiles of processesfollowing Weibull distributions with known shape parameter. The construct and propertiesof unbiased control charts are theoretically studied. The performance of the proposed charts isevaluated and compared using average run lengths. A numerical application concerning productlife tests is presented to illustrate the methods.KEY WORDS: Average run length; censored data; probability limits; statistical process control;unbiased Shewhart chart.
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