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Resistive Switching in Metal Oxide Films Deposited by Metalorganic Chemical Vapor Deposition

机译:金属有机化学气相沉积沉积的金属氧化物膜中的电阻转换

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Pr_(1-x)Ca_xMnO_3 (PCMO) films were deposited by metalorganic chemical vapor deposition using in situ infrared spectroscopic monitoring. The I-V characteristics were investigated in the PCMO-based devices exhibiting electrical-pulse-induced resistive switching. The frequency response analysis suggested that the resistance switching in the PCMO-based devices was mainly due to the resistance change in the interface between the film and the electrode.
机译:Pr_(1-x)Ca_xMnO_3(PCMO)膜是使用原位红外光谱监测通过金属有机化学气相沉积法沉积的。在表现出电脉冲感应电阻切换的基于PCMO的设备中研究了I-V特性。频率响应分析表明,基于PCMO的设备中的电阻切换主要是由于薄膜与电极之间界面的电阻变化所致。

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