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The Researches on Target WIP Optimization of the Bottleneck Equipment Group

机译:瓶颈设备群的目标在制品优化研究

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In this paper, we study the target WIP optimization problem of the bottleneck equipment group on the semiconductor production line. Based on the constructed target WIP calculating formula of the bottleneck equipment group, the problem of optimizing target WIP of the bottleneck equipment group is transformed into the problem of seeking for an optimal value of target WIP safety factor which is a variable in the formula. With that an optimization algorithm is designed for solving the optimal value of target WIP safety factor of the bottleneck equipment group. The algorithm is realized by integrating GA and simulation. Finally a simulation case study is presented based on a Mini-Fab model with all of the essential features of the semiconductor production line. Further we point out that it is a dynamic course for optimizing the target WIP of the bottleneck equipment group.
机译:在本文中,我们研究了半导体生产线上瓶颈设备组的目标在制品优化问题。基于瓶颈设备组的目标WIP计算公式,将瓶颈设备组的目标WIP优化问题转化为寻求目标WIP安全因子最优值的问题,该最优值是公式中的变量。以此为基础,设计了一种优化算法来解决瓶颈设备组的目标在制品安全系数的最优值。该算法是通过综合遗传算法和仿真实现的。最后,基于Mini-Fab模型提供了一个仿真案例研究,该模型具有半导体生产线的所有基本特征。此外,我们指出这是优化瓶颈设备组目标WIP的动态过程。

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