Low-cost and high-power-density resistive fault-current limiting elements using YBCO thin films and Au-Ag alloy shunt layers

摘要

We propose a new design for the high-temperature superconducting thin-film fault-current limiter (FCL), which uses high-resistivity Au-Ag alloy shunt layers instead of the pure gold (or silver) shunt layers conventionally used. An FCL element (5 mm wide and 40 mm long) with a YBCO thin film (THEVA) and a parallel inductively-wound shunt resistor successfully withstood very high electric field (> 44 V_(peak)/cm) for 5 cycles (0.1 sec) after switching, and achieved a very high switching power density, ～2.0 kVA/cm~2. We confirmed similar maximum tolerable electric field (> 40 V_(peak)/cm, limited by power supply) in a larger sample (1 cm × 6 cm). The composition of our FCL element is very simple, and the achieved power density is more than five times higher than conventional devices, which leads to a dramatic reduction in the amount of expensive superconducting thin films. We made a conceptual design and cost estimation of our FCL elements used in a typical 6.6 kV FCL.