首页> 外文会议>International Symposium on Test and Measurement;ISTM/2005 >High-capacity Flash Memory’s Application in Stored Testing and Measuring System
【24h】

High-capacity Flash Memory’s Application in Stored Testing and Measuring System

机译:大容量闪存在存储测试系统中的应用

获取原文

摘要

K9K1G08UOM is a non-volatile, mass storage device developed by SAMSUNG.. This paper introduces in detail its architecture and work principle. Its application in stored testing and measuring system is also given. It’s imbedded controller, status register,and instruction sets make itself apply flexible to various storage system electric circuit. In addition, it’s data bus and address bus can share same ports with 8-bits. These not only reduce its pin numbers but also make it easily enlareg memory size. The paper also offered a kind of solution when it is used in solid state file storage, digital signal processing, and so on..
机译:K9K1G08UOM是由三星公司开发的非易失性大容量存储设备。本文详细介绍了其结构和工作原理。还给出了其在存储测试和测量系统中的应用。它内置的控制器,状态寄存器和指令集使其可以灵活地应用于各种存储系统电路。此外,它的数据总线和地址总线可以共享8位的相同端口。这些不仅减少了它的针脚数量,而且使它很容易扩大内存的大小。本文还提供了一种用于固态文件存储,数字信号处理等方面的解决方案。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号