Preferred Position of the Detector for MeV Backscattering Spectrometry

摘要

When an amorphous target is tilted with respect to the incident beam, the yield of an MeV backscattering spectrum will not change height if the measurements are executed under suitable conditions. One of these involves the position of the detector with respect to the plane defined by the directions of the incident beam and the tilt axis, as demonstrated here. The results clarify early data on the subject.