At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test methodologies, which can be used by processors to test themselves at-speed. Currently, Built-In Self-Test (BIST) is the primary self-test methodology available and is widely used for testing embedded memory cores. In this paper, we report our experiences in applying a commercial BIST methodology to two processor cores and analyze the problems associated with the current hardware-based BIST methodologies. We propose a new software-based self-testing methodology for processors, which uses a software tester embedded in the processor memory as a vehicle for applying structural tests. The software tester consists of programs for test generation and test application. Prior to the test, structural tests are prepared for processor components in the form of self-test signatures. During the process of self-test, the test generation program expands the self-test signatures into test sets, and the test application program applies the tests to the components-under-test at the speed of the processor. Application of the novel software-based self-test method demonstrates its significant cost/fault coverage benefits and its ability to apply at-speed test while alleviating the need for high-speed testers.
使用外部测试仪对GHz处理器进行全速测试可能在技术上和经济上都不可行。因此,迫切需要低成本,高质量的自测方法,处理器可以使用这种方法来进行自测。当前,内置自测(BIST)是可用的主要自测方法,并广泛用于测试嵌入式内存内核。在本文中,我们报告了将商业BIST方法应用于两个处理器内核的经验,并分析了与当前基于硬件的BIST方法相关的问题。我们为处理器提出了一种新的基于软件的自测试方法,该方法使用嵌入在处理器内存中的软件测试器作为应用结构测试的工具。软件测试器由用于测试生成和测试应用程序的程序组成。在测试之前,将以自检签名的形式为处理器组件准备结构测试。在自测试过程中,测试生成程序将自测试签名扩展到测试集中,并且测试应用程序以处理器的速度将测试应用于被测组件。基于软件的新型自检方法的应用证明了其显着的成本/故障覆盖范围优势以及在进行高速测试的同时可以减轻对高速测试仪的需求的能力。 P>
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