We have proposed a new pump-and-probe technique, subpicosecond time resolved X-ray diffractometry, which enables the direct observation of the lattice movement in the transient processes of the subpicosecond order. This technique uses a subpicosecond electron pulse from a linac, which produces various radiations as a pump pulse and the characteristic X-ray in a copper target as a probe pulse. Using the EGS4 code, we have found that the subpicosecond X-ray pulse can be generated in a sufficient intensity and purity for this technique. Preliminary experiments have been also performed using the NERL electron linac and several diffraction images were obtained for typical monocrystals such as silicon.
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