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System Improvements and Discussion to Minimize Lightning Arcs or Crazing

机译:系统改进和讨论,以最大限度地减少闪电或裂缝

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摘要

The technology exists to advance film properties and improve throughput in large area systems. However, defects caused by system limitations prevent implementation of new process capabilities. Using the electrical models that show the causes of the lightning arc events, system design recommendations have been identified, implemented, and proven to be effective. Several system design recommendations are proposed to minimize the unintended current paths in large area systems and the reason they are effective.
机译:该技术存在于推进胶片特性,提高大面积系统的吞吐量。但是,由系统限制引起的缺陷可防止实现新的过程功能。使用显示闪电事件原因的电气模型,已确定,实施和已被证明是有效的系统设计建议。提出了一些系统设计建议,以最大限度地减少大面积系统中的意外电流路径以及它们有效的原因。

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