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Wafer preparation : Ultra-Clean Processing and Si-material defects

机译:晶圆准备:超净加工和硅材料缺陷

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In the very competitive international IC-market, companies are driven towards producing increasingly complex IC-designs at a constantly decreasing cost-per-function. This has been one of the major driving forces behind the continuous scaling down of the minimum device dimensions. Despite the increase in density obtained by this, the chip size has grown dramatically over the last years. Due to this trend, an economically feasible production could only be obtained by a continuous decrease in the defect density and process variability in order to obtain high process yields. Improvements in the Si-wafer quality, lowering of the process-induced contamination level and a tighter process control have, therefore, been key issues over the last years for companies in order to stay ahead of the competition. There is no doubt that the availability of better wafers and cleaner process materials (such as chemicals, DI water, and process gases) significantly contributed to the success and continuous growth of this industry.
机译:在竞争激烈的国际IC市场中,公司被迫以不断降低的每功能成本来生产日益复杂的IC设计。这一直是不断缩小最小器件尺寸的主要驱动力之一。尽管由此获得了密度的提高,但在过去几年中,芯片尺寸却有了巨大的增长。由于这种趋势,只能通过连续降低缺陷密度和工艺可变性来获得经济上可行的生产,以便获得高工艺产量。因此,为了保持竞争优势,过去几年来,提高硅晶片质量,降低工艺引起的污染水平以及加强工艺控制已成为公司的关键问题。毫无疑问,更好的晶圆和更清洁的处理材料(例如化学药品,去离子水和处理气体)的可用性极大地促进了该行业的成功和持续发展。

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