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LOW TEMPERATURE CRYSTALLIZATION OF SrBi_2Ta_2O_9 FILM BY EXCIMER LASER IRRADIATION

机译:通过准分子激光照射SRBI_2TA_2O_9膜的低温结晶

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Using a KrF or ArF excimer laser as an irradiation photon source, we have succeeded in crystallizing amorphous SrBi_2Ta_2O_9 films at 200-290 °C, quite lower temperatures than the conventional crystallization temperature. The crystallization is enhanced when the substrate temperature, irradiation time, or the laser power density is higher.
机译:使用KRF或ARF准分子激光器作为照射光子源,我们在200-290℃下成功地结晶无定形SRBI_2TA_2O_9薄膜,比传统的结晶温度相当较低。当衬底温度,照射时间或激光功率密度更高时,结晶增强。

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