Characterization of metalized polypropylene film used in capacitors and the effect of compression on the dielectric breakdown strength

摘要

Principal directions of stress for an anisotropic metalized polypropylene film have been determined using vibrational holographic interferometry. This technique, coupled with techniques such as high pressure gas dilatometry, PVT and TMA, has been used to mechanically characterize the metalized PP film widely used in the capacitor industry. The anisotropic film has large differences in its out-of-plane modulus and thermal expansion coefficient when compared to the respective in-plane constants.