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Sampling Plan for Poit-To-Point Performance Test of Touch Trigger Probes on Coordinate Measuring Machines

机译:坐标测量机上接触触发探针点对点性能测试的采样计划

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Touch trigger probes are devices through which coordinate measuring machines (CMMs) collect dimensional measurement data in modern manufacturing environments. The vast majority of probes used on CMMs are touch triger probes, and most of these probes employ a kinematic seating mechanism for the probe stylus (Reid, 1993). Point-to-point probing test is typically used to evaluate touch trigger probe performance. The test method secpified in the ANSI (American National Standards Institute) B89 standard consists of measuring 49 points on a highly spherical reference ball and the 49 points are distributed by following a sampling plan or test pattern (ANSI, 1991). the user is allowed to specify desired sampling plan which contains 49 points. Standards of other countries usually require that a number of points are taken over one hemisphere of a reference ball roughly uniformly distributed. (For example, fifty points are used in VDI/VDE 2617 standard.) A best-fit sphere is then computed using the manufacturer's recommended algorithms (usually least squares) and the set of radii to each probing point (from the best-fit center) is calculated. The range of the 49 radii is defined as the point-to-point perfomrance index.
机译:接触式触发探针是坐标测量机(CMM)通过其在现代制造环境中收集尺寸测量数据的设备。三坐标测量机上使用的绝大多数探针是接触触发式探针,并且这些探针中的大多数都采用运动学的探针触针定位机制(Reid,1993年)。点对点探测测试通常用于评估触摸触发式探针的性能。 ANSI(美国国家标准协会)B89标准中确定的测试方法包括:在高度球形的参考球上测量49个点,并通过遵循抽样计划或测试模式来分布这49个点(ANSI,1991)。用户可以指定所需的采样计划,该计划包含49个点。其他国家/地区的标准通常要求在大致均匀分布的参考球的一个半球上获取多个点。 (例如,在VDI / VDE 2617标准中使用了五十个点。)然后使用制造商推荐的算法(通常是最小二乘方)和每个探测点的半径集(从最佳拟合中心算出)来计算最佳拟合球)进行计算。 49半径的范围定义为点对点性能指数。

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