Lumen Degradation and Chromaticity Shift in Glass and Silicone Based High-Power Phosphor-Converted White-Emitting Diodes under Thermal Tests

摘要

The lumen degradation and chromaticity shift in glass and silicone based high-power phosphor-converted white-emitting diodes (PC-WLEDs) under accelerated thermal tests at 150°C, 200°C, and 250°C are presented and compared. The glass based PC-WLEDs exhibited better thermal stability than the silicone by 4.8 time reductions in lumen loss 6.8 time reductions in chromaticity shift at 250°C, respectively. The mean-time-to-failure (MTTF) evaluation of glass and silicone based high-power PC-WLEDs in accelerated thermal tests is also presented and compared. The results showed that the glass based PC-WLEDs exhibited higher MTTF than the silicone by 7.53 times in lumen loss and 14.4 times in chromaticity shift at 250°C, respectively. The thermal performance of lumen, chromaticity, and MTTF investigations demonstrated that the thermal stability of the glass based PC-WLEDs were better than the silicone. A better thermal stability phosphor layer of glass as encapsulation material may be beneficial to the many applications where the LED modules with high power and high reliability are demanded.