Single shot femtosecond laser ablation of Copper: Experiment vs. Simulation

摘要

Single 5 and 40 femtosecond, near IR pulses with fluences varying from 0.4 - 80 J/cm~2 from a Ti:Sapphire laser was focused onto a single crystal Cu sample surface with 2.0 μm focal spot at 15 and 45 degree angle of incidence. The surface profiles after interaction were studied with an interferometric depth profiler (Wyko NT9100), and benchmarked against crater size and morphology predicted by 2D Particle-In-Cell (PIC) laser damage simulation model [Mitchell et al. Opt. Eng. 53, 122507 (2014), Opt. Lett. 40, 2189 (2015) ].