Degradation of electrochromic film of amorphous tungsten oxide after coloration

摘要

Abstract: The degradation of the electrochromic film of a-WO$-3$/ was investigated from the equilibrium state of different driving voltage and the time dependent emf was also obtained in an open or short circuit of zero volts. Based on the mechanism of activation and the principal of chemical reaction kinetics, the correct definition of electrochromic memory was made and a relation of memory was obtained. It was also found that at the initial time of natural bleaching, the change rate of proton concentration in the film was also obtained. According to the mechanism of electrochromic memory, it was indicated that in the open circuit case, the theoretical reaction of the change rate of electric potential was in good agrement with the experimental results, and furthermore, the reaction constant was determined with the experimental data. In the short circuit case, there exist two effects on degradation, the short circuit current caused by the backward emf, and the oxidation of the colored film. The experimental data shows that, in the short circuit case, the degradation strongly depends on the short circuit current and the effect of chemical reaction can be neglected. !7