A functional partitioning expert system for test sequences generation

摘要

In this paper, we describe a functional partitioning Expert System. Our ultimate goal is the generation of test sequences for digital circuits, using both conventional tools and AI techniques.

We describe at first an open infrastructure we are implementing; it allows the integration of specific tools (e.g. expert systems) in a hierarchical description of technical systems. Then we present the partitioning Expert System we are building, being the first step towards test generation at board level.