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Thermoelectric properties of Sn-based clathrates

机译:锡基包合物的热电性能

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Inorganic clathrates consisting in group-IV elements have crystal structures with large cages. Electronic structure and transport properties of Sn-based clathrate semiconductors have been studied by the ab-initio band structure calculating method. In this calculation the FLAPW method with the GGA is used and the Ga configuration of occupied sites is determined by the comparison of the total energy E/sub tot/ among various configurations. The band gap of the calculated electronic structure E/sub g/ is 0.16 eV, which agrees with the experimental result, estimated by the temperature dependence of the electric conductivity. However the band gap E/sub g/=0.16 eV does not explain the experimental Seebeck coefficient /spl alpha/. When we assume a lager band gap E/sub g/=0.45 eV and a carrier concentration n/sub e/=8/spl times/10/sup 18//cm/sup 3/, the calculated /spl alpha/ reasonably explains the experimental data.
机译:IV族元素组成的无机包合物具有大笼状的晶体结构。通过从头算带结构计算方法研究了锡基包合物半导体的电子结构和传输性能。在此计算中,使用了具有GGA的FLAPW方法,并且通过比较各种配置中的总能量E / subt /来确定占用位置的Ga配置。计算出的电子结构E / sub g /的带隙为0.16 eV,与电导率的温度依赖性所估计的实验结果一致。然而,带隙E / sub g / = 0.16 eV不能解释实验塞贝克系数/ spl alpha /。当我们假设更大的带隙E / sub g / = 0.45 eV和载流子浓度n / sub e / = 8 / spl次/ 10 / sup 18 // cm / sup 3 /时,计算出的/ spl alpha /可以合理地解释实验数据。

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