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Single crystal growth of homologous compounds in the ZnO-In/sub 2/O/sub 3/ system and thermoelectric properties

机译:ZnO-In / sub 2 / O / sub 3 /体系中同源化合物的单晶生长及热电性能

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Single crystals of (ZnO)/sub 5/In/sub 2/O/sub 3/ were grown by a normal flux method, using PbF/sub 2/ as a flux, and the resulting flaky single crystals were very thin along the c-axis. Single crystal quality was evaluated by XRD, TEM, and SEM. Band gap energy of single crystal was optically determined. The inplane electrical conductivity (/spl sigma/), and Seebeck coefficient (cc) were measured in the temperature range of 300 K to 1200 K and 500 K to 1200 K in air, respectively. The electrical conductivity of a single crystal was found to be 2/spl times/10/sup 6/ Sm/sup -1/ at room temperature, it decreased with increasing temperature and attained a value of 5/spl times/10/sup 5/ Sm/sup -1/ at 1200 K. Anisotropy of two orders of magnitude in electrical conductivity was first clarified. Seebeck coefficient was determined to be -9.6 /spl mu/VK/sup -1/ at 500 K and -31.6 /spl mu/VK/sup -1/ at 1200 K. The estimated power factor was about 1.4/spl times/10/sup -4/ Wm/sup -1/K/sup -2/ at 500 K. This factor increased with temperature, and reached the value of 5.3/spl times/10/sup -4/ Wm/sup -1/K/sup -2/ at 1200 K.
机译:(ZnO)/ sub 5 / In / sub 2 / O / sub 3 /的单晶以PbF / sub 2 /为助熔剂通过常规通量法生长,所得薄片状单晶沿c方向非常薄。 -轴。通过XRD,TEM和SEM评估单晶质量。用光学方法测定单晶的带隙能。在空气中分别在300 K至1200 K和500 K至1200 K的温度范围内测量平面内电导率(/ spl sigma /)和塞贝克系数(cc)。发现单晶的电导率在室温下为2 / spl×10 / sup 6 / Sm / sup -1 /,随着温度的升高而降低,并达到5 / spl×10 / sup 5的值。 / Sm / sup -1 /在1200K。首先澄清了电导率两个数量级的各向异性。确定塞贝克系数在500 K时为-9.6 / spl mu / VK / sup -1 /在1200 K时为-31.6 / spl mu / VK / sup -1 /在1200 K.估计的功率因数约为1.4 / spl次/ 10 / sup -4 / Wm / sup -1 / K / sup -2 /在500 K时。此因数随温度增加而增加,达到5.3 / spl次的值/ 10 / sup -4 / Wm / sup -1 / K / sup -2 /在1200 K时。

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