Bifurcation phenomena in the Colpitts oscillator: a robustness analysis

摘要

A robustness assessment for the results of a bifurcation analysis of the Colpitts oscillator is presented. It is shown, by means of SPICE simulations, that the bifurcation phenomena occurring in the oscillator are relatively independent of the particular choice of the transistor model. Furthermore, the simulation results exhibit good agreement with the theoretical predictions. It is also demonstrated, through circuit experiments, that the predicted behaviors can be reproduced experimentally in a robust way.