首页> 外文会议> >Characterization of indirectly measurable antenna balun/impedance-matching device
【24h】

Characterization of indirectly measurable antenna balun/impedance-matching device

机译:间接可测天线巴伦/阻抗匹配装置的特性

获取原文

摘要

This paper presents a novel approach for the S-parameter characterization of an indirectly measurable antenna balun/impedance-matching device. A back-to-back measurement set-up is proposed and a system of complex variable nonlinear equations is derived to relate the measurable undesired parameters and the unmeasurable desired parameters. Then the genetic algorithm (GA) is proposed to solve the system of complex variable nonlinear equations to obtain the desired S-parameters. Unlike conventional GA, the chromosomes in our approach are represented directly by complex numbers instead of normal binary coding. The representation of chromosome in complex number increases the efficiency and flexibility of GA in engineering applications. With the GA-solved S-parameters, we are able to characterize the antenna input impedances. The simulated and measured results of the antenna system show that the proposed GA approach is valid and this approach can also be extended to some other indirect measurement.
机译:本文提出了一种新颖的方法,用于间接测量天线巴伦/阻抗匹配设备的S参数表征。提出了一种背对背的测量装置,并推导了一个复杂的可变非线性方程组,将可测量的不希望参数和不可测量的期望参数联系起来。然后提出了遗传算法(GA)来求解复杂的非线性变量方程组,以获得所需的S参数。与常规GA不同,我们的方法中的染色体直接由复数表示,而不是由正常的二进制编码表示。染色体以复数表示可以提高遗传算法在工程应用中的效率和灵活性。利用GA求解的S参数,我们可以表征天线输入阻抗。天线系统的仿真和测量结果表明,所提出的遗传算法是有效的,并且该方法还可以扩展到其他间接测量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号