A symbolic approach for testability evaluation in fault diagnosis of nonlinear analog circuits is presented. The new approach extends the methodologies developed for the linear case to circuits where nonlinear components, such as diodes or transistors, are present. The testability evaluation is a fundamental information for the fault diagnosis process, whatever method will be used, also in the nonlinear case. An example of circuit verifying this consideration and the validity of the proposed approach is briefly presented.
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