The materials investigated in this paper are PZT thick films on polycrystalline Al/sub 2/O/sub 3/-substrates metallized with a Pt-electrode. The uniformly polarized films were locally polarized in the opposite direction with a metallic electrode as well as with an electron beam in the SEM. The surface potential resulting from the latent charge image at the film surface was measured after polarization and after contrast enhancement by corona charging. Furthermore, the potential contrast could be visualized in the SEM at small accelerating voltages and minimal sample currents. The depth profile of the polarization perpendicular to the film surface was measured by the pyroelectric laser intensity modulation method (LIMM). The influence of film inhomogeneities on the surface potential is discussed.
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机译:本文研究的材料是在Pt电极金属化的多晶Al / sub 2 / O / sub 3 /衬底上的PZT厚膜。均匀偏振膜在相反方向上用金属电极以及在SEM中用电子束局部偏振。在极化之后和通过电晕充电增强对比度之后,测量由膜表面的潜电荷图像产生的表面电势。此外,在较小的加速电压和最小的采样电流下,可以在SEM中看到潜在的对比度。通过热电激光强度调制方法(LIMM)测量垂直于膜表面的偏振的深度分布。讨论了膜不均匀性对表面电势的影响。
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