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An exact evaluation of Kirchhoff approximation for backscattering from a one-dimensional rough surface

机译:从一维粗糙表面向后散射的基尔霍夫近似的精确评估

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The backscattered total intensity is evaluated without using any further approximation and the results are compared with those of the zeroth-order and the first-order approximated physical optics (PO) models. In other words, the exactly evaluated Kirchhoff approximation (KA) solution has been used to examine the effects of the slope terms and the edge term. Since the evaluation of backscattering from a two-dimensional rough surface requires a very long computing time, only one-dimensional rough dielectric and conducting surface is considered. The exactly evaluated KA solution is verified with a moment method (MM) solution for a rough surface.
机译:在不使用任何进一步近似的情况下评估背向散射的总强度,并将结果与​​零阶和一阶近似物理光学(PO)模型的结果进行比较。换句话说,已精确评估的基尔霍夫近似(KA)解已用于检查斜率项和边项的影响。由于评估二维粗糙表面的反向散射需要非常长的计算时间,因此仅考虑一维粗糙介电和导电表面。精确评估的KA解决方案已通过矩量法(MM)解决方案验证了粗糙表面。

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