Tuple detection for path delay faults: a method for improving test set quality

摘要

To improve the quality of test sets for path delay faults, we describe a variation of n-detection test generation based on the concept of m-tuple detection. An m-tuple test set for a set of path delay faults P includes a test for every m-tuple of faults defined over P. Such a test set has the following advantages. (1) Similar to an n-detection test set, it results in several tests for every path delay fault p /spl isin/ P, increasing the likelihood of testing p under worst-case delay conditions. (2) It increases the likelihood of accidentally detecting nontarget path delay faults, which are not included in P, more effectively than a conventional n-detection test set. Experimental results demonstrate that m-tuple test generation for m = 2 is manageable in terms of test set size and run time increase relative to conventional test generation.