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Development of nuclear radiation detectors with energy discrimination capabilities based on thick CdTe layers grown by metalorganic vapor phase epitaxy

机译:基于金属有机气相外延生长的厚CdTe层,开发具有能量识别能力的核辐射探测器

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We report on the development of nuclear radiation detectors based on epitaxially grown thick single crystalline CdTe layers. The optimization of the CdTe growth on the GaAs substrates in a metalorganic vapor phase epitaxy resulted high-structural quality and thick CdTe layers of thickness up to 200 /spl mu/m. Radiation detectors were fabricated by growing a 2-5 /spl mu/m thick iodine-doped n-CdTe buffer layer on the n/sup +/-GaAs substrate, followed by about 100 /spl mu/m thick undoped p-like CdTe layer. The heterojunction diode detectors exhibited good rectification property and good charge transport property. The detector showed reverse bias leakage currents typically from 1 to 5 /spl mu/A/cm/sup 2/ at 40V bias, and clearly demonstrated its energy discrimination capability by resolving the 59.54 keV gamma peak from the /sup 241/Am radioisotope during the radiation detection test. Some results on direct growth of CdTe epilayers on Si substrates are also presented.
机译:我们报告基于外延生长的厚单晶CdTe层的核辐射探测器的发展。在金属有机气相外延中,Gas衬底上CdTe生长的优化导致了高结构质量和厚达200μg/ spl mu / m的厚CdTe层。通过在n / sup +/- GaAs衬底上生长2-5 / spl mu / m厚的掺碘n-CdTe缓冲层,然后再添加约100 / spl mu / m厚的未掺杂p型CdTe,来制造辐射探测器。层。异质结二极管检测器表现出良好的整流性能和良好的电荷传输性能。该检测器在40V偏压下显示出的反向偏压泄漏电流通常为1至5 / spl mu / A / cm / sup 2 /,并通过解析/ sup 241 / Am放射性同位素中的59.54 keVγ峰,清楚地证明了其能量分辨能力。辐射检测测试。还介绍了在CdTe外延层上直接生长在Si衬底上的一些结果。

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